Test without a trace
The probe pins only touch the material at a tiny point and only apply enough pressure to make a secure connection, but the material will not be deformed. The vertical placement of the pins causes no scratches, furrows or grooves and the Device under Test (DUT) leaves the test socket almost without trace.
From 0.3 mm Pitch
More and more contacts in less and less space require the highest degree of precision. YAMAICHI ELECTRONICS specialises in high-precision test solutions and offers test sockets from a pitch of 0.3 mm in the highest material and production quality.
Best Materials
YAMAICHI ELECTRONICS uses only high quality materials for its test sockets. The housings are made of PEEK and anodised aluminum. The individually tested probe pins are made of a beryllium copper alloy coated with nickel and gold. For special requirements also pins with other surfaces can be used.
Extremely durable
YAMAICHI ELECTRONICS guarantees up to 50,000 mating cycles for each FPC/FFC test socket. The test sockets are adapted to the customer needs. Upon request, the right PCB is delivered as well.
